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- Eupec Power Semiconductors
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- Eupec Power Semiconductors
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- Eupec Power Semiconductors
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- Eupec Power Semiconductors
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Product Details Search Results:
Eupec.com/T12N11COB
{"I(T) Max.(A) On-state Current":"12","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-103varM6","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"50","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
954 Bytes - 23:50:17, 30 March 2025
Eupec.com/T12N11COC
{"I(T) Max.(A) On-state Current":"12","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-103varM6","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"400","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
954 Bytes - 23:50:17, 30 March 2025
Eupec.com/T12N11COE
{"I(T) Max.(A) On-state Current":"12","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-103varM6","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"200","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
954 Bytes - 23:50:17, 30 March 2025
Eupec.com/T12N11UOB
{"I(T) Max.(A) On-state Current":"12","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-103var1/4","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"50","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
955 Bytes - 23:50:17, 30 March 2025
Eupec.com/T12N11UOC
{"I(T) Max.(A) On-state Current":"12","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-103var1/4","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"400","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
957 Bytes - 23:50:17, 30 March 2025
Eupec.com/T12N11UOE
{"I(T) Max.(A) On-state Current":"12","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-103var1/4","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"200","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
957 Bytes - 23:50:17, 30 March 2025
Vishay.com/T12N1100COB
{"I(T) Max.(A) On-state Current":"12±","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-208varM6","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"50","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
953 Bytes - 23:50:17, 30 March 2025
Vishay.com/T12N1100COC
{"I(T) Max.(A) On-state Current":"12±","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-208varM6","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"400","I(GT) Max. (A)":"50m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
954 Bytes - 23:50:17, 30 March 2025
Vishay.com/T12N1100COE
{"I(T) Max.(A) On-state Current":"19±","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-208varM6","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"200","I(GT) Max. (A)":"40m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
954 Bytes - 23:50:17, 30 March 2025
Vishay.com/T12N1100UOB
{"I(T) Max.(A) On-state Current":"19±","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-208AA","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"50","I(GT) Max. (A)":"40m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
950 Bytes - 23:50:17, 30 March 2025
Vishay.com/T12N1100UOC
{"I(T) Max.(A) On-state Current":"19±","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-208AA","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"400","I(GT) Max. (A)":"40m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
950 Bytes - 23:50:17, 30 March 2025
Vishay.com/T12N1100UOE
{"I(T) Max.(A) On-state Current":"19±","V(T) Max. (V)":"2.8","@Temp. (°C) (Test Condition)":"125","@ t(w) (s) (Test Condition)":"10m","I(H) Max.(A) Holding Current":"100m","@I(T) (A) (Test Condition)":"60","Package":"TO-208AA","V(DRM) Max.(V)Rep.Pk.Off Volt.":"1.1k","dv/dt Min. (V/us)":"200","I(GT) Max. (A)":"40m","V(GT) Max.(V)":"2.0","Military":"N","I(D) Max. (A) Leakage Current":"5.0m","I(TSM) Max. (A)":"220","t(q) Typ. (s)":"60u"}...
951 Bytes - 23:50:17, 30 March 2025
Documentation and Support
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